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Home - Testing the connected car, Anritsu to feature solution at Automotive Test Expo
Connected CarsFeaturedInternet of Things (IoT)Test and Measurement

Testing the connected car, Anritsu to feature solution at Automotive Test Expo

by Phillip Tracy October 20, 2016
written by Phillip Tracy October 20, 2016 Share
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source: Anritsu
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Anritsu will showcase test solutions that verify connected car designs at the Automotive Test Expo to be held Oct. 25-27 in Novi, Michigan. In addition to product demonstrations, Anritsu will present a roadmap on LTE and how to test connected car systems using wireless technology.

The company will be showing off the Signal Analyzer MS2692A and its new dedicated short-range communications capability that the company claims can more efficiently and economically verify chipsets and modules designed into connected cars. A vehicle-to-vehicle and vehicle-to-infrastructure protocol monitor and message viewer allow the MS2692A to validate V2X messages of both roadside units and on-board units. Test costs are further reduced via the RF Automation Measurement Tool for the V2X transmission test that supports V2X standards for analyzing transmit power, modulation, spectrum emission masks, spurious emissions and other parameters, according to Anritsu. The MS2692A can capture and replay V2X/DSRC signals with an optional built-in vector signal generator.

source: Anritsu

Source: Anritsu

The Anritsu booth also will feature the new Cellular Module Test Application software for the Signaling Tester MD8475A/B, which the test and measurement company claims simplifies testing chipsets and automotive-related telematics modules. The software, along with the SmartStudio GUI of the MD8475A/B, allows automotive manufacturers and suppliers to  verify operation in carrier environments to lower test costs and speed time to market, according to Anritsu.

source: Anritsu

Source: Anritsu

For cellular telematics radio frequency testing, Anritsu will display its Radio Communication Analyzer MT8821C. The single-instrument solution supports all major wireless technologies and provides measurement functions with support for LTE-Advanced testing of up to 5CC carrier aggregation, up to 4×4 multiple-input/multiple output, and up to 4CC carrier aggregation with 2×2 MIMO.

Anritsu will present The Road to LTE: Connected Cars, LTE Roadmap and Test Solutions, on the Open Technology Forum stage on Oct. 25 at 1 p.m., to explain the importance of understanding new LTE developments in both networks and chipsets.

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